MACHINE LEARNING-BASED FAULT PREDICTION IN VLSI CIRCUITS USING DFT TEST DATA. International Journal of Food and Nutritional Sciences, [S. l.], v. 9, n. 3, p. 582–590, 2020. Disponível em: https://www.ijfans.org/index.php/Journal/article/view/7363. Acesso em: 8 sep. 2026.